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نام مجله: IEEE Transactions on Reliability
موارد یافت شده: 3
1 - On Reliability Analysis of k -Out-of-n: F Systems Equipped With a Single Cold Standby Component Under Degradation Performance (چکیده)2 - Goodness-of-fit Test Based on Kullback-Leibler Information for Progressively Type-II Censored Data (چکیده)
3 - Testing exponentiality based on Kullback-Leibler information with progressively Type-II censored data (چکیده)
